True, deep-trench imaging capability for Atomic Force Microscopy, with CNT AFM probes from C|D|I

Opening new avenues for research

CNT AFM probes are considered to be the ideal probe for many AFM applications. They can be made sharper and are inherently stronger than silicon probes. Carbon Core probes from C|D|I offer the additional advantages of being straight, with higher durability (longer life), and flexibility that can significantly improve the performance of an AFM.

Atomic Force Microscopy techniques are used for a wide variety of industrial and research applications. These range from inspection to metrology to better understanding about how living cells interact in their environment. C|D|I probes offer AFM users in semiconductor, material science, life science, polymer science the ability to obtain consistently better results than any other probe available today. In addition, they will help to open new avenues of research for AFM such as the delivery chemicals/drugs directly into an interior feature within the cell, real deep trench measurements for semiconductors and more.

Submit images

We are looking for “before and after” images taken using another probe and a new Carbon Core probe from C|D|I. We will award a $100 gift certificate to Amazon.com for the best images submitted each month.

If you have images you would like to submit, contact us at: info@cdi-nano.com or upload the images online.

• Please include the following information:
• Name, address of company/institution
• Investigator name
• Contact name
• Contact phone number and email address
• AFM instrument model
• Types of tips used – before and after
• High-resolution image of sample
• Description of sample image

We look forward to hearing from you!