C|D|I, Carbon Design Innovations, Inc. manufactures carbon nanotube (CNT) probes for atomic force microscopy (AFM).

Carbon Design Innovations, Inc. Receives U.S. Patent for Fabrication of a Carbon Nanotube (CNT) Device

Method used for producing CNT atomic force microscopy (AFM) probes

Burlingame, Calif., November 3, 2009 – Carbon Design Innovations, Inc. (C|D|I) today announced that they have received a key technology patent for the fabrication of carbon nanotube (CNT) devices. The United States Patent #7,601,650 was issued on October 13, 2009 for a variety of methods and techniques for fabricating an improved CNT device such as an AFM probe. (more)

CNT Probes at the angle you need

Materials Today, November 2009 Features
C|D|I's New CNT AFM probe technology

Why do we have a money back guarantee
for our probe performance?
A letter from Vance Nau, Ph.D. CEO of Carbon Design Innovations

C|D|I Receives $390,000 NIH Grant

C|D|I Awarded CNT Device Patent

See us at the Biophysical Society Annual Meeting
February 21-23, 2010
Booth #224
Moscone Convention Center
San Francisco, CA

Straight and stabilized CNT AFM probes by Carbon Design Innovations

Typical CNT probe

C|D|I straightened CNT probe

Stabilization coating secures the attachment to the probe